Professor Kim, Jeongtae is a full professor in the Department of Electronics Engineering in the Ewha Womans University. He is actively doing research on image signal processing. He received his B.S. and M.S degree in Control and Instrumentation Engineering from the Seoul National University ,Seoul, Korea, and his Ph. D. degree in Electrical engineering and Computer Science from the University of Michigan, Ann Arbor, USA. From 1991 to 1998, he had worked for Samsung Electronics where he had been engaged in the development of digital systems such as digital TV and home network system. Since Mar. 2004, he has been with the Department of Electronics Engineering in the Ewha Womens University , currently as a full professor. He has published research articles in prominent international journals by conducting research on statistical signal processing, medical image processing, microscopy image restoration, signal processing for CMOS image sensor, computational photography and image processing for light field camera, etc.
Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression ModulesIEEE ACCESS, 2023, v.11, 66017-66027
Spatial and Channel-Wise Co-Attention-Based Twin Network System for Inspecting Integrated Circuit SubstrateIEEE Transactions on Semiconductor Manufacturing, 2023, v.36 no.3, 434-444
Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal RegionsInternational Journal of Precision Engineering and Manufacturing, 2020, v.21 no.4, 0
A comparative study of transfer learning-based methods for inspection of mobile camera modulesIEIE Transactions on Smart Processing and Computing, 2018, v.7 no.1, 70-74
Fast computation of projection image based on the repeated patterns of intersection between ray and voxelTransactions of the Korean Institute of Electrical Engineers, 2017, v.66 no.6, 942-948
Alternating minimization of the negative Poisson likelihood function for the global analysis of fluorescence lifetime imaging microscopy dataOPTICS EXPRESS, 2014, v.22 no.21, 24977-24987
[학술지논문] Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules
IEEE ACCESS, 2023, v.11
no.1
, 66017-66027
SCIE
[학술지논문] Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2020, v.21
no.4
, 747-758