이화여자대학교

Jeong-Tae Kim Professor

Electronic & Electrical Engineering/Semiconductor Engineering/ Graduate Program in System Health and Engineering

김정태 프로필 사진 
Professor Kim, Jeongtae is a full professor in the Department of Electronics Engineering in the Ewha Womans University. He is actively doing research on image signal processing. He received his B.S. and M.S degree in Control and Instrumentation Engineering from the Seoul National University ,Seoul, Korea, and his Ph. D. degree in Electrical engineering and Computer Science from the University of Michigan, Ann Arbor, USA. From 1991 to 1998, he had worked for Samsung Electronics where he had been engaged in the development of digital systems such as digital TV and home network system. Since Mar. 2004, he has been with the Department of  Electronics Engineering in the Ewha Womens University , currently as a full professor. He has published research articles in prominent international journals by conducting research on statistical signal processing, medical image processing, microscopy image restoration, signal processing for CMOS image sensor, computational photography and image processing for light field camera, etc.
  • Asan Engineering Building #529
  • 02-3277-4084
  • Office hours
    • 화 2-4시, 목 5-7시
Research Record
  • Anomaly Detection Using Normalizing Flow-Based Density Estimation and Synthetic Defect Classification IEEE ACCESS, 2024, v.12, 75873-75887
    SCIE Scopus dColl.
  • Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules IEEE ACCESS, 2023, v.11, 66017-66027
    SCIE Scopus dColl.
  • Spatial and Channel-Wise Co-Attention-Based Twin Network System for Inspecting Integrated Circuit Substrate IEEE Transactions on Semiconductor Manufacturing, 2023, v.36 no.3, 434-444
    SCIE Scopus dColl.
  • Robust Change Detection Using Channel-Wise co-Attention-Based Siamese Network With Contrastive Loss Function IEEE ACCESS, 2022, v.10, 45365-45374
    SCIE Scopus dColl.
  • Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions International Journal of Precision Engineering and Manufacturing, 2020, v.21 no.4, 0
    SCIE Scopus KCI dColl.
  • Image Reconstruction of Moving Objects Using Multiple IR-UWB Radar Signals IEEE Sensors Journal, 2019, v.19 no.20, 9402-9410
    SCIE Scopus dColl.
  • Joint Banknote Recognition and Counterfeit Detection Using Explainable Artificial Intelligence SENSORS, 2019, v.19 no.16, 3607
    SCIE Scopus dColl.
  • Machine Learning-Based Fast Banknote Serial Number Recognition Using Knowledge Distillation and Bayesian Optimization SENSORS, 2019, v.19 no.19, 4218
    SCIE Scopus dColl.
  • Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices ELECTRONICS, 2019, v.8 no.5, 533
    SCIE Scopus dColl.
  • A comparative study of transfer learning-based methods for inspection of mobile camera modules IEIE Transactions on Smart Processing and Computing, 2018, v.7 no.1, 70-74
    Scopus KCI dColl.
  • Fast computation of projection image based on the repeated patterns of intersection between ray and voxel Transactions of the Korean Institute of Electrical Engineers, 2017, v.66 no.6, 942-948
    Scopus KCI dColl.
  • Depth-based refocusing for reducing directional aliasing artifacts OPTICS EXPRESS, 2016, v.24 no.24, 28065-28079
    SCIE Scopus dColl.
  • Parametric Blind Restoration of Bi-level Images with Unknown Intensities IEIE Transactions on Smart Processing & Computing, 2016, v.5 no.5, 319
    KCI후보 dColl.
  • Alternating minimization of the negative Poisson likelihood function for the global analysis of fluorescence lifetime imaging microscopy data OPTICS EXPRESS, 2014, v.22 no.21, 24977-24987
    SCIE Scopus dColl.
  • [학술지논문] Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules IEEE ACCESS, 2023, v.11 no.1 , 66017-66027
    SCIE
  • [학술지논문] Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2020, v.21 no.4 , 747-758
    SCIE
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Courses

  • 2024-2nd

    • Digital Signal Processing and Laboratory

      • Subject No 34309Class No 01
      • 3Year ( 3Credit , 3Hour) Mon 5~5 (ENG A107) , Wed 4~4 (ENG A410(A)) , Wed 5~5 (ENG A410()
      • Exchange students are not allowed
        • Syllabus(File)

    • Smart Factory Capstone Design

  • 2024-1st

    • Digital Image Processing

      • Subject No 36515Class No 01
      • 4Year ( 3Credit , 3Hour) Mon 6~6 (ENG ) , Wed 5~5 (153)
        • Syllabus(File)

    • Mathematics for System Design

      • Subject No G14692Class No 01
      • Year ( 3Credit , 3Hour) Tue 2~3 (ENG )
      • Classroom Changed
        • Syllabus(File)

    • Smart Factory Capstone Design

  • 2023-2nd

    • Signals & Systems

      • Subject No 30272Class No 01
      • 2Year ( 3Credit , 3Hour) Mon 3~3 (ENG A) , Wed 2~2 (101)
        • Syllabus(File)

    • Digital Signal Processing and Laboratory

      • Subject No 34309Class No 01
      • 3Year ( 3Credit , 3Hour) Mon 5~5 (ENG A107) , Wed 4~4 (ENG A410(A)) , Wed 5~5 (ENG A410()
        • Syllabus(File)

    • Smart Factory Capstone Design

  • 2023-1st

    • Digital Image Processing

      • Subject No 36515Class No 01
      • 4Year ( 3Credit , 3Hour) Mon 3~3 (ENG A107) , Wed 2~2 (ENG A107)
        • Syllabus(File)

    • Smart Factory Capstone Design

  • 2022-2nd

    • Digital Signal Processing and Laboratory

      • Subject No 34309Class No 01
      • 3Year ( 3Credit , 3Hour) Wed 5~5 (ENG A410(A)) , Wed 6~6 (ENG A410() , Mon 6~6 ())
        • Syllabus(File)

  • 2022-1st

    • Digital Image Processing

      • Subject No 36515Class No 01
      • 4Year ( 3Credit , 3Hour) Tue 3~3 (ENG ) , Thu 2~2 (153)
        • Syllabus(File)
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Academic Background

University of Michigan Ph.D.(전기공학)