Byung-Uk Lee Professor Emeritus
Byung-Uk Lee received a B.S. degree in Electronic Engineering from Seoul National University in 1979, and the M.S. degree in Electrical Science from the KAIST in 1981, and a Ph.D. in Electrical Engineering from Stanford University in 1991. He worked for Daewoo Electronics Co. from 1981 to 1985 and from 1991 to 1995. He joined the Department of Electronics Engineering, Ewha W. University in 1995, where he is currently a professor. His research interest includes image denoising and medical image processing.
Research Record
- 360 degrees Image Reference-Based Super-Resolution Using Latitude-Aware Convolution Learned From Synthetic to Real IEEE ACCESS, 2021, v.9, 155924-155935
- Color image enhancement with high saturation using piecewise linear gamut mapping JOURNAL OF VISUAL COMMUNICATION AND IMAGE REPRESENTATION, 2020, v.67, 102759
- Estimation of illumination spectrum from a hyperspectral image IEIE Transactions on Smart Processing and Computing, 2019, v.8 no.2, 95-99
- Error rate of automated calculation for wound surface area using a digital photography SKIN RESEARCH AND TECHNOLOGY, 2018, v.24 no.1, 117-122
- Early Seizure Detection by Applying Frequency-Based Algorithm Derived from the Principal Component Analysis FRONTIERS IN NEUROINFORMATICS, 2017, v.11
- Geometric Correction of Projected Images on Curved Surfaces using Unobtrusive Patterns IEIE Transactions on Smart Processing & Computing, 2017, v.6 no.5, 317~325
- Ridge and furrow pattern classification for acral lentiginous melanoma using dermoscopic images Biomedical Signal Processing and Control, 2017, v.32, 90-96
- Defocus and geometric distortion correction for projected images on a curved surface APPLIED OPTICS, 2016, v.55 no.4, 896-902
- Fisheye lens correction by estimating 3D location Journal of WSCG, 2016, v.24 no.1, 19-24
- Sequential Change of Wound Calculated by Image Analysis Using a Color Patch Method during a Secondary Intention Healing PLOS ONE, 2016, v.11 no.9
- Estimation of multiexponential fluorescence decay parameters using compressive sensing Journal of Biomedical Optics, 2015, v.20 no.9
- Poisson-Gaussian Noise Reduction Using the Hidden Markov Model in Contourlet Domain for Fluorescence Microscopy Images PLOS ONE, 2015, v.10 no.9
- Removing boundary effect of a patch-based super-resolution algorithm IEICE Transactions on Information and Systems, 2015, v.E98D no.4, 976-979
- Segmentation of wounds using gradient vector flow ICIIBMS 2015 - International Conference on Intelligent Informatics and Biomedical Sciences, 2015, 24 March 2016, 390-391
- Determination of Noise Threshold from Signal Histogram in the Wavelet Domain 전자공학회논문지, 2014, 제51권 2호, 156-160
- Performance of bilateral filtering on Gaussian noise JOURNAL OF ELECTRONIC IMAGING, 2014, v.23 no.4
- [학술지논문] Color image enhancement with high saturation using piecewise linear gamut mapping JOURNAL OF VISUAL COMMUNICATION AND IMAGE REPRESENTATION, 2020, v.67 no.0 , 102759-102759
- [학술지논문] ESTIMATION OF ILLUMINATION SPECTRUM FROM A HYPERSPECTRAL IMAGE IEIE Transactions on Smart Processing & Computing, 2019, v.8 no.2 , 95-99
- [학술발표] CNN 기반 다시점 360도 비디오 초해상화 영상처리및이해에 관한 워크샵, 대한민국, 제주시, 2020-02-06 제32회영상처리및이해에 관한 워크샵 논문집, 2020, 1-4
- [학술발표] Kim, Hee-Jae, Je-Won Kang, and Byung-Uk Lee Asia-Pacific Signal and Information Processing Association Annual Summit and Conference (APSIPA), 뉴질랜드, Aukland, 2020-12-10 Proceeding of APSIPA, 2020, 1283-1286
- [학술발표] Analysis of illumination correction in camera color space International Symposium on Electronic Imaging, 미국, San Francisco, 2019-01-15 Color Imaging XXIV, 2019, 093-1-093-4
Courses
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2021-2nd
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Signals & Systems 강의 계획서 상세보기
- Subject No 30272Class No 01
- 2Year ( 3Credit , 3Hour) Mon 5~5 , Wed 4~4
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Scene Analysis
- Subject No G14672Class No 01
- Year ( 3Credit , 3Hour) Mon 3~3 (ENG A521) , Wed 3~3 (ENG A521)
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2021-1st
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Digital Image Processing
- Subject No 36515Class No 01
- 4Year ( 3Credit , 3Hour) Wed 6~6 , Fri 4~4
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Advanced Programming for Electronics Engineering
- Subject No 37275Class No 01
- 2Year ( 3Credit , 3Hour) Mon 5~5 (ENG A101) , Wed 4~4 (ENG A410)
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Academic Background
Stanford University Ph.D.(전기공학)